Structure and Electronic Properties of Ultrathin Dielectric Films on Silicon and Related Structures: Volume 592

Structure and Electronic Properties of Ultrathin Dielectric Films on Silicon and Related Structures: Volume 592
Author :
Publisher : Mrs Proceedings
Total Pages : 408
Release :
ISBN-10 : UOM:39015050054850
ISBN-13 :
Rating : 4/5 ( Downloads)

Book Synopsis Structure and Electronic Properties of Ultrathin Dielectric Films on Silicon and Related Structures: Volume 592 by : D. A. Buchanan

Download or read book Structure and Electronic Properties of Ultrathin Dielectric Films on Silicon and Related Structures: Volume 592 written by D. A. Buchanan and published by Mrs Proceedings. This book was released on 2000-10-17 with total page 408 pages. Available in PDF, EPUB and Kindle. Book excerpt: The MRS Symposium Proceeding series is an internationally recognised reference suitable for researchers and practitioners. The book, first published in 2000, includes detailed theoretical studies of the nature of SiO2 and its interface with silicon, electron paramagnetic resonance for the study of defects, electron tunneling, and band alignment among others.


Structure and Electronic Properties of Ultrathin Dielectric Films on Silicon and Related Structures: Volume 592 Related Books

Structure and Electronic Properties of Ultrathin Dielectric Films on Silicon and Related Structures: Volume 592
Language: en
Pages: 408
Authors: D. A. Buchanan
Categories: Technology & Engineering
Type: BOOK - Published: 2000-10-17 - Publisher: Mrs Proceedings

DOWNLOAD EBOOK

The MRS Symposium Proceeding series is an internationally recognised reference suitable for researchers and practitioners. The book, first published in 2000, in
Structure and Electronic Properties of Ultrathin Dielectric Films on Silicon and Related Structures
Language: en
Pages: 386
Authors:
Categories: Dielectric films
Type: BOOK - Published: 1999 - Publisher:

DOWNLOAD EBOOK

Oxide Reliability: A Summary Of Silicon Oxide Wearout, Breakdown, And Reliability
Language: en
Pages: 281
Authors: David J Dumin
Categories: Technology & Engineering
Type: BOOK - Published: 2002-01-18 - Publisher: World Scientific

DOWNLOAD EBOOK

This book presents in summary the state of our knowledge of oxide reliability. The articles have been written by experts who are among the most knowledgeable in
Interfaces, Adhesion, and Processing in Polymer Systems
Language: en
Pages: 232
Authors: Spiros Haralambos Anastasiadis
Categories: Science
Type: BOOK - Published: 2001 - Publisher:

DOWNLOAD EBOOK

Thermoelectric Materials 2000 - The Next Generation Materials for Small-Scale Refrigeration and Power Generation Applications: Volume 626
Language: en
Pages: 434
Authors: Terry M. Tritt
Categories: Technology & Engineering
Type: BOOK - Published: 2001-03 - Publisher:

DOWNLOAD EBOOK

The presentations from the symposium are grouped into the following topics: skutterudites, superlattice, new materials, quantum wires and dots, half-heusler all