Spectroscopic Ellipsometry and Reflectometry

Spectroscopic Ellipsometry and Reflectometry
Author :
Publisher : Wiley-Interscience
Total Pages : 0
Release :
ISBN-10 : 0471181722
ISBN-13 : 9780471181729
Rating : 4/5 (729 Downloads)

Book Synopsis Spectroscopic Ellipsometry and Reflectometry by : Harland G. Tompkins

Download or read book Spectroscopic Ellipsometry and Reflectometry written by Harland G. Tompkins and published by Wiley-Interscience. This book was released on 1999-03-18 with total page 0 pages. Available in PDF, EPUB and Kindle. Book excerpt: While single wave ellipsometry has been around for years, spectroscopic ellipsometry is fast becoming the method of choice for measuring the thickness and optical properties of thin films. This book provides the first practical introduction to spectroscopic ellipsometry and the related techniques of reflectometry. A guide for practitioners and researchers in a variety of disciplines, it addresses a broad range of applications in physics, chemistry, electrical engineering, and materials science.


Spectroscopic Ellipsometry and Reflectometry Related Books

Spectroscopic Ellipsometry and Reflectometry
Language: en
Pages: 0
Authors: Harland G. Tompkins
Categories: Science
Type: BOOK - Published: 1999-03-18 - Publisher: Wiley-Interscience

DOWNLOAD EBOOK

While single wave ellipsometry has been around for years, spectroscopic ellipsometry is fast becoming the method of choice for measuring the thickness and optic
Spectroscopic Ellipsometry And Reflectometry User'S Guide
Language: it
Pages: 0
Authors: H.G. Tompkins
Categories:
Type: BOOK - Published: - Publisher:

DOWNLOAD EBOOK

Spectroscopic Ellipsometry
Language: en
Pages: 138
Authors: Harland G. Tompkins
Categories: Technology & Engineering
Type: BOOK - Published: 2015-12-16 - Publisher: Momentum Press

DOWNLOAD EBOOK

Ellipsometry is an experimental technique for determining the thickness and optical properties of thin films. It is ideally suited for films ranging in thicknes
Spectroscopic Ellipsometry
Language: en
Pages: 388
Authors: Hiroyuki Fujiwara
Categories: Technology & Engineering
Type: BOOK - Published: 2007-09-27 - Publisher: John Wiley & Sons

DOWNLOAD EBOOK

Ellipsometry is a powerful tool used for the characterization of thin films and multi-layer semiconductor structures. This book deals with fundamental principle
Design and Performance of an Infrared Spectroscopic Ellipsometer/reflectometer for Thin-film Characterization
Language: en
Pages: 188
Authors: Michael Scott Thomas
Categories: Ellipsometry
Type: BOOK - Published: 1996 - Publisher:

DOWNLOAD EBOOK