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Radiation Effects And Soft Errors In Integrated Circuits And Electronic Devices
Language: en
Pages: 349
Authors: Ronald D Schrimpf
Categories: Technology & Engineering
Type: BOOK - Published: 2004-07-29 - Publisher: World Scientific

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This book provides a detailed treatment of radiation effects in electronic devices, including effects at the material, device, and circuit levels. The emphasis
Radiation Effects and Soft Errors in Integrated Circuits and Electronic Devices
Language: en
Pages: 354
Authors: Dan M. Fleetwood
Categories: Technology & Engineering
Type: BOOK - Published: 2004 - Publisher: World Scientific

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This book provides a detailed treatment of radiation effects in electronic devices, including effects at the material, device, and circuit levels. The emphasis
Soft Errors
Language: en
Pages: 532
Authors: Jean-Luc Autran
Categories: Technology & Engineering
Type: BOOK - Published: 2017-12-19 - Publisher: CRC Press

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Soft errors are a multifaceted issue at the crossroads of applied physics and engineering sciences. Soft errors are by nature multiscale and multiphysics proble
Soft Errors
Language: en
Pages: 432
Authors: Jean-Luc Autran
Categories: Technology & Engineering
Type: BOOK - Published: 2017-12-19 - Publisher: CRC Press

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Soft errors are a multifaceted issue at the crossroads of applied physics and engineering sciences. Soft errors are by nature multiscale and multiphysics proble
Frontiers In Electronics
Language: en
Pages: 335
Authors: Sorin Cristoloveanu
Categories: Technology & Engineering
Type: BOOK - Published: 2009-08-06 - Publisher: World Scientific

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Frontiers in Electronics contains the selected best papers presented at the Workshop on Frontiers in Electronics (WOFE-07). This meeting was the fifth in the se