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Logic Testing and Design for Testability
Language: en
Pages: 0
Authors: Hideo Fujiwara
Categories: Computers
Type: BOOK - Published: 1985-06 - Publisher:

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Design for testability techniques offer one approach toward alleviating this situation by adding enough extra circuitry to a circuit or chip to reduce the compl
Logic Testing and Design for Testability
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Pages: 298
Authors: Hideo Fujiwara
Categories: Business & Economics
Type: BOOK - Published: 1985-06-01 - Publisher: MIT Press (MA)

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Today's computers must perform with increasing reliability, which in turn depends onthe problem of determining whether a circuit has been manufactured properly
VLSI Test Principles and Architectures
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Authors: Laung-Terng Wang
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This book is a comprehensive guide to new DFT methods that will show the readers how to design a testable and quality product, drive down test cost, improve pro
An Introduction to Logic Circuit Testing
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An Introduction to Logic Circuit Testing provides a detailed coverage of techniques for test generation and testable design of digital electronic circuits/syste
Logic Testing and Design for Testability
Language: en
Pages:
Authors: E. N. Murphy
Categories:
Type: BOOK - Published: 1985 - Publisher:

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