Electrically Based Microstructural Characterization III: Volume 699

Electrically Based Microstructural Characterization III: Volume 699
Author :
Publisher :
Total Pages : 406
Release :
ISBN-10 : UOM:39015055599842
ISBN-13 :
Rating : 4/5 ( Downloads)

Book Synopsis Electrically Based Microstructural Characterization III: Volume 699 by : Rosario A. Gerhardt

Download or read book Electrically Based Microstructural Characterization III: Volume 699 written by Rosario A. Gerhardt and published by . This book was released on 2002-09-05 with total page 406 pages. Available in PDF, EPUB and Kindle. Book excerpt: Among the topics of invited papers are the electrical characterization of inhomogeneous and heterogeneous systems with microstructural periodicity, impedance spectroscopy in ferromagnetic materials, the materials characterization and device performance of a CMR- ferroelectric heterostructure, and broadband dielectric spectroscopic investigations into the influence of confinement on the molecular reorientational dynamics of liquid crystals. Many papers besides the 48 selected here are expected to appear in various scientific journals. Annotation copyrighted by Book News, Inc., Portland, OR


Electrically Based Microstructural Characterization III: Volume 699 Related Books

Electrically Based Microstructural Characterization III: Volume 699
Language: en
Pages: 406
Authors: Rosario A. Gerhardt
Categories: Science
Type: BOOK - Published: 2002-09-05 - Publisher:

DOWNLOAD EBOOK

Among the topics of invited papers are the electrical characterization of inhomogeneous and heterogeneous systems with microstructural periodicity, impedance sp
Electrically Based Microstructural Characterization II.
Language: en
Pages:
Authors:
Categories:
Type: BOOK - Published: - Publisher:

DOWNLOAD EBOOK

Electrically Based Microstructural Characterization II:
Language: en
Pages: 384
Authors: Rosario A. Gerhardt
Categories: Technology & Engineering
Type: BOOK - Published: 2014-06-05 - Publisher: Cambridge University Press

DOWNLOAD EBOOK

This book provides a forum for researchers who have been using a variety of electrical measurements as a means to obtain microstructural information about their
Silicon Materials-Processing, Characterization and Reliability: Volume 716
Language: en
Pages: 704
Authors: Janice L. Veteran
Categories: Science
Type: BOOK - Published: 2002-10-11 - Publisher:

DOWNLOAD EBOOK

The MRS Symposium Proceeding series is an internationally recognised reference suitable for researchers and practitioners.
Kelvin Probe Force Microscopy
Language: en
Pages: 530
Authors: Sascha Sadewasser
Categories: Science
Type: BOOK - Published: 2018-03-09 - Publisher: Springer

DOWNLOAD EBOOK

This book provides a comprehensive introduction to the methods and variety of Kelvin probe force microscopy, including technical details. It also offers an over