Applied Scanning Probe Methods XIII

Applied Scanning Probe Methods XIII
Author :
Publisher : Springer Science & Business Media
Total Pages : 284
Release :
ISBN-10 : 9783540850496
ISBN-13 : 354085049X
Rating : 4/5 (49X Downloads)

Book Synopsis Applied Scanning Probe Methods XIII by : Bharat Bhushan

Download or read book Applied Scanning Probe Methods XIII written by Bharat Bhushan and published by Springer Science & Business Media. This book was released on 2008-10-29 with total page 284 pages. Available in PDF, EPUB and Kindle. Book excerpt: The volumes XI, XII and XIII examine the physical and technical foundation for recent progress in applied scanning probe techniques. The first volume came out in January 2004, the second to fourth volumes in early 2006 and the fifth to seventh volumes in late 2006. The field is progressing so fast that there is a need for a set of volumes every 12 to 18 months to capture latest developments. These volumes constitute a timely comprehensive overview of SPM applications. After introducing scanning probe microscopy, including sensor technology and tip characterization, chapters on use in various industrial applications are presented. Industrial applications span topographic and dynamical surface studies of thin-film semiconductors, polymers, paper, ceramics, and magnetic and biological materials. The chapters have been written by leading researchers and application scientists from all over the world and from various industries to provide a broader perspective.


Applied Scanning Probe Methods XIII Related Books

Applied Scanning Probe Methods XIII
Language: en
Pages: 284
Authors: Bharat Bhushan
Categories: Technology & Engineering
Type: BOOK - Published: 2008-10-29 - Publisher: Springer Science & Business Media

DOWNLOAD EBOOK

The volumes XI, XII and XIII examine the physical and technical foundation for recent progress in applied scanning probe techniques. The first volume came out i
Applied Scanning Probe Methods XI
Language: en
Pages: 281
Authors: Bharat Bhushan
Categories: Technology & Engineering
Type: BOOK - Published: 2008-10-22 - Publisher: Springer Science & Business Media

DOWNLOAD EBOOK

The volumes XI, XII and XIII examine the physical and technical foundation for recent progress in applied scanning probe techniques. These volumes constitute a
Applied Scanning Probe Methods XII
Language: en
Pages: 271
Authors: Bharat Bhushan
Categories: Technology & Engineering
Type: BOOK - Published: 2008-10-24 - Publisher: Springer Science & Business Media

DOWNLOAD EBOOK

Crack initiation and growth are key issues when it comes to the mechanical reliab- ity of microelectronic devices and microelectromechanical systems (MEMS). Es-
Applied Scanning Probe Methods VIII
Language: en
Pages: 512
Authors: Bharat Bhushan
Categories: Technology & Engineering
Type: BOOK - Published: 2007-12-20 - Publisher: Springer Science & Business Media

DOWNLOAD EBOOK

The volumes VIII, IX and X examine the physical and technical foundation for recent progress in applied scanning probe techniques. This is the first book to sum
Applied Scanning Probe Methods I
Language: en
Pages: 485
Authors: Bharat Bhushan
Categories: Technology & Engineering
Type: BOOK - Published: 2014-02-26 - Publisher: Springer Science & Business Media

DOWNLOAD EBOOK

Examining the physical and technical foundation for recent progress with this technique, Applied Scanning Probe Methods offers a timely and comprehensive overvi