Advancing Metrology for Electrotechnology to Support the U.S. Economy

Advancing Metrology for Electrotechnology to Support the U.S. Economy
Author :
Publisher : DIANE Publishing
Total Pages : 85
Release :
ISBN-10 : 9780788177019
ISBN-13 : 078817701X
Rating : 4/5 (01X Downloads)

Book Synopsis Advancing Metrology for Electrotechnology to Support the U.S. Economy by : Joanne Surette

Download or read book Advancing Metrology for Electrotechnology to Support the U.S. Economy written by Joanne Surette and published by DIANE Publishing. This book was released on 1999-04 with total page 85 pages. Available in PDF, EPUB and Kindle. Book excerpt: Presents an overview of work completed in 1997 in the Electronics & Electrical Engineering Laboratory (EEEL) of the National Institute of Standards & Technology. Selected technological accomplishments in the following fields are detailed: semiconductors, magnetics, superconductors, low frequency, microwaves, lightwaves, video, power, electromagnetic compatibility, electronic data exchange, & national electrical standards. Includes a profile of EEEL & its programs, projects, executive structure, awards & recognition, & management staff. Photographs, graphs & diagrams.


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