A Practical Guide to Transmission Electron Microscopy, Volume II
Author | : Zhiping Luo |
Publisher | : Momentum Press |
Total Pages | : 223 |
Release | : 2015-12-23 |
ISBN-10 | : 9781606509180 |
ISBN-13 | : 1606509187 |
Rating | : 4/5 (187 Downloads) |
Download or read book A Practical Guide to Transmission Electron Microscopy, Volume II written by Zhiping Luo and published by Momentum Press. This book was released on 2015-12-23 with total page 223 pages. Available in PDF, EPUB and Kindle. Book excerpt: Transmission Electron Microscope (TEM) is a very powerful tool for characterizing various types of materials. Using a light microscope, the imaging resolution is at several hundred nanometers, and for a Scanning Electron Microscope (SEM) at several nanometers. The imaging resolution of the TEM, however, can routinely reach several angstroms on a modem instrument. In addition, the TEM can also provide material structural information, since the electrons penetrate through the thin specimens, and chemical compositional information due to the strong electron-specimen atom interactions. This book provides a concise practical guide to the TEM user, starting from the beginner level, including upper-division undergraduates, graduates, researchers, and engineers, on how to learn TEM efficiently in a short period of time. Volume I covers the instrumentation, sample preparation, fundamental diffraction, imaging, analytical microscopy, and some newly developed microscopy techniques. This book may serve as a textbook for a TEM course or workshop, or a reference book for the TEM user to improve their TEM skills.