Related Books

X-ray Scattering Investigations of Metallic Thin Films
Language: en
Pages: 128
Authors: Andrew P. Warren
Categories:
Type: BOOK - Published: 2013 - Publisher:

DOWNLOAD EBOOK

Nanometric thin films are used widely throughout various industries and for various applications. Metallic thin films, specifically, are relied upon extensively
Thin Film Analysis by X-Ray Scattering
Language: en
Pages: 378
Authors: Mario Birkholz
Categories: Technology & Engineering
Type: BOOK - Published: 2006-05-12 - Publisher: John Wiley & Sons

DOWNLOAD EBOOK

With contributions by Paul F. Fewster and Christoph Genzel While X-ray diffraction investigation of powders and polycrystalline matter was at the forefront of m
Thin Film Analysis by X-Ray Scattering
Language: en
Pages: 378
Authors: Mario Birkholz
Categories: Technology & Engineering
Type: BOOK - Published: 2005-12-23 - Publisher: Wiley-VCH

DOWNLOAD EBOOK

With contributions by Paul F. Fewster and Christoph Genzel While X-ray diffraction investigation of powders and polycrystalline matter was at the forefront of m
High-Resolution X-Ray Scattering
Language: en
Pages: 410
Authors: Ullrich Pietsch
Categories: Technology & Engineering
Type: BOOK - Published: 2013-03-09 - Publisher: Springer Science & Business Media

DOWNLOAD EBOOK

During the last 20 years interest in high-resolution x-ray diffractometry and reflectivity has grown as a result of the development of the semiconductor industr
Anomalous X-Ray Scattering for Materials Characterization
Language: en
Pages: 224
Authors: Yoshio Waseda
Categories: Technology & Engineering
Type: BOOK - Published: 2003-07-01 - Publisher: Springer

DOWNLOAD EBOOK

The production of multi layered thin films with sufficient reliability is a key technology for device fabrication in micro electronics. In the Co/Cu type multi