VLSI Test Principles and Architectures
| Author | : Laung-Terng Wang |
| Publisher | : Elsevier |
| Total Pages | : 809 |
| Release | : 2006-08-14 |
| ISBN-10 | : 9780080474793 |
| ISBN-13 | : 0080474799 |
| Rating | : 4/5 (799 Downloads) |
Book Synopsis VLSI Test Principles and Architectures by : Laung-Terng Wang
Download or read book VLSI Test Principles and Architectures written by Laung-Terng Wang and published by Elsevier. This book was released on 2006-08-14 with total page 809 pages. Available in PDF, EPUB and Kindle. Book excerpt: This book is a comprehensive guide to new DFT methods that will show the readers how to design a testable and quality product, drive down test cost, improve product quality and yield, and speed up time-to-market and time-to-volume. Most up-to-date coverage of design for testability. Coverage of industry practices commonly found in commercial DFT tools but not discussed in other books. Numerous, practical examples in each chapter illustrating basic VLSI test principles and DFT architectures.
