Related Books
Language: en
Pages: 775
Pages: 775
Type: BOOK - Published: 2012-10-14 - Publisher: Springer Science & Business Media
This book explains concepts of transmission electron microscopy (TEM) and x-ray diffractometry (XRD) that are important for the characterization of materials. T
Language: en
Pages: 764
Pages: 764
Type: BOOK - Published: 2012-10-13 - Publisher: Springer Science & Business Media
This book explains concepts of transmission electron microscopy (TEM) and x-ray diffractometry (XRD) that are important for the characterization of materials. T
Language: en
Pages: 778
Pages: 778
Type: BOOK - Published: 2002 - Publisher: Springer Science & Business Media
Inelastic electron scattering and spectroscopy. Diffraction from crystals. Electron diffraction and crystallography.
Language: en
Pages: 763
Pages: 763
Type: BOOK - Published: 2013-06-29 - Publisher: Springer Science & Business Media
This practical and theoretical text/reference develops the concepts of transmission electron microscopy and x-ray diffractometry. This acclaimed new edition con
Language: en
Pages: 741
Pages: 741
Type: BOOK - Published: 2003-03-27 - Publisher: Cambridge University Press
A graduate level textbook covering the fundamentals of conventional transmission electron microscopy, first published in 2003.
