Nanoscale Characterization of Surfaces and Interfaces
Author | : N. John DiNardo |
Publisher | : John Wiley & Sons |
Total Pages | : 173 |
Release | : 2008-09-26 |
ISBN-10 | : 9783527615940 |
ISBN-13 | : 3527615946 |
Rating | : 4/5 (946 Downloads) |
Download or read book Nanoscale Characterization of Surfaces and Interfaces written by N. John DiNardo and published by John Wiley & Sons. This book was released on 2008-09-26 with total page 173 pages. Available in PDF, EPUB and Kindle. Book excerpt: Derived from the highly acclaimed series Materials Science and Technology, this book provides in-depth coverage of STM, AFM, and related non-contact nanoscale probes along with detailed applications, such as the manipulation of atoms and clusters on a nanometer scale. The methods are described in terms of the physics and the technology of the methods and many high-quality images demonstrate the power of these techniques in the investigation of surfaces and the processes which occur on them. Topics include: Semiconductor Surfaces and Interfaces * Insulators * Layered Compounds * Charge Density Wave Systems * Superconductors * Electrochemisty at Liquid-Solid Interfaces * Biological Systems * Metrological Applications * Nanoscale Surface Forces * Nanotribology * Manipulation on the Nanoscale Materials scientists, surface scientists, electrochemists, as well as scientists working in catalysis and microelectronics will find this book an invaluable source of information