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Type: BOOK - Published: 2003-11-26 - Publisher: Springer Science & Business Media
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Defect and Microstructure Analysis by Diffraction is focused on extracting information on the real structure of materials from their diffraction patterns. The p
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Type: BOOK - Published: 2013-03-21 - Publisher: John Wiley & Sons
Microstructural characterization is usually achieved by allowing some form of probe to interact with a carefully prepared specimen. The most commonly used probe
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Type: BOOK - Published: 2014-03-31 - Publisher: IGI Global
X-ray line profile analysis is an effective and non-destructive method for the characterization of the microstructure in crystalline materials. Supporting resea
Language: en
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Pages: 406
Type: BOOK - Published: 2010-03-11 - Publisher: Springer Science & Business Media
Electron backscatter diffraction is a very powerful and relatively new materials characterization technique aimed at the determination of crystallographic textu