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Atomic Force Microscopy
Language: en
Pages: 329
Authors: Bert Voigtländer
Categories: Science
Type: BOOK - Published: 2019-05-23 - Publisher: Springer

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This book explains the operating principles of atomic force microscopy with the aim of enabling the reader to operate a scanning probe microscope successfully a
Atomic Force Microscopy
Language: en
Pages: 496
Authors: Greg Haugstad
Categories: Science
Type: BOOK - Published: 2012-09-24 - Publisher: John Wiley & Sons

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This book enlightens readers on the basic surface properties and distance-dependent intersurface forces one must understand to obtain even simple data from an a
Atomic Force Microscopy in Process Engineering
Language: en
Pages: 300
Authors: W. Richard Bowen
Categories: Technology & Engineering
Type: BOOK - Published: 2009-06-30 - Publisher: Butterworth-Heinemann

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This is the first book to bring together both the basic theory and proven process engineering practice of AFM. It is presented in a way that is accessible and v
Noncontact Atomic Force Microscopy
Language: en
Pages: 410
Authors: Seizo Morita
Categories: Technology & Engineering
Type: BOOK - Published: 2009-09-18 - Publisher: Springer Science & Business Media

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Since the original publication of Noncontact Atomic Force Microscopy in 2002, the noncontact atomic force microscope (NC-AFM) has achieved remarkable progress.
Noncontact Atomic Force Microscopy
Language: en
Pages: 468
Authors: S. Morita
Categories: Mathematics
Type: BOOK - Published: 2002-07-24 - Publisher: Springer Science & Business Media

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Since 1995, the noncontact atomic force microscope (NC-AFM) has achieved remarkable progress. Based on nanomechanical methods, the NC-AFM detects the weak attra