Related Books
Language: en
Pages: 329
Pages: 329
Type: BOOK - Published: 2019-05-23 - Publisher: Springer
This book explains the operating principles of atomic force microscopy with the aim of enabling the reader to operate a scanning probe microscope successfully a
Language: en
Pages: 496
Pages: 496
Type: BOOK - Published: 2012-09-24 - Publisher: John Wiley & Sons
This book enlightens readers on the basic surface properties and distance-dependent intersurface forces one must understand to obtain even simple data from an a
Language: en
Pages: 300
Pages: 300
Type: BOOK - Published: 2009-06-30 - Publisher: Butterworth-Heinemann
This is the first book to bring together both the basic theory and proven process engineering practice of AFM. It is presented in a way that is accessible and v
Language: en
Pages: 410
Pages: 410
Type: BOOK - Published: 2009-09-18 - Publisher: Springer Science & Business Media
Since the original publication of Noncontact Atomic Force Microscopy in 2002, the noncontact atomic force microscope (NC-AFM) has achieved remarkable progress.
Language: en
Pages: 468
Pages: 468
Type: BOOK - Published: 2002-07-24 - Publisher: Springer Science & Business Media
Since 1995, the noncontact atomic force microscope (NC-AFM) has achieved remarkable progress. Based on nanomechanical methods, the NC-AFM detects the weak attra