Atomic Force Microscopy

Atomic Force Microscopy
Author :
Publisher : Springer
Total Pages : 329
Release :
ISBN-10 : 9783030136543
ISBN-13 : 303013654X
Rating : 4/5 (54X Downloads)

Book Synopsis Atomic Force Microscopy by : Bert Voigtländer

Download or read book Atomic Force Microscopy written by Bert Voigtländer and published by Springer. This book was released on 2019-05-23 with total page 329 pages. Available in PDF, EPUB and Kindle. Book excerpt: This book explains the operating principles of atomic force microscopy with the aim of enabling the reader to operate a scanning probe microscope successfully and understand the data obtained with the microscope. This enhanced second edition to "Scanning Probe Microscopy" (Springer, 2015) represents a substantial extension and revision to the part on atomic force microscopy of the previous book. Covering both fundamental and important technical aspects of atomic force microscopy, this book concentrates on the principles the methods using a didactic approach in an easily digestible manner. While primarily aimed at graduate students in physics, materials science, chemistry, nanoscience and engineering, this book is also useful for professionals and newcomers in the field, and is an ideal reference book in any atomic force microscopy lab.


Atomic Force Microscopy Related Books

Atomic Force Microscopy
Language: en
Pages: 329
Authors: Bert Voigtländer
Categories: Science
Type: BOOK - Published: 2019-05-23 - Publisher: Springer

DOWNLOAD EBOOK

This book explains the operating principles of atomic force microscopy with the aim of enabling the reader to operate a scanning probe microscope successfully a
Air Force AFM.
Language: en
Pages: 528
Authors:
Categories:
Type: BOOK - Published: 1962 - Publisher:

DOWNLOAD EBOOK

Atomic Force Microscopy
Language: en
Pages: 496
Authors: Greg Haugstad
Categories: Science
Type: BOOK - Published: 2012-09-24 - Publisher: John Wiley & Sons

DOWNLOAD EBOOK

This book enlightens readers on the basic surface properties and distance-dependent intersurface forces one must understand to obtain even simple data from an a
Atomic Force Microscopy
Language: en
Pages: 257
Authors: Peter Eaton
Categories: Science
Type: BOOK - Published: 2010-03-25 - Publisher: Oxford University Press

DOWNLOAD EBOOK

Atomic force microscopes are very important tools for the advancement of science and technology. This book provides an introduction to the microscopes so that s
Surface Analysis with STM and AFM
Language: en
Pages: 335
Authors: Sergei N. Magonov
Categories: Technology & Engineering
Type: BOOK - Published: 2008-09-26 - Publisher: John Wiley & Sons

DOWNLOAD EBOOK

Scanning tunneling microscopy (STM) and atomic force microscopy (AFM) are powerful tools for surface examination. In the past, many STM and AFM studies led to e