Physical Aspects of Electron Microscopy and Microbeam Analysis
| Author | : Benjamin M. Siegel |
| Publisher | : |
| Total Pages | : 496 |
| Release | : 1975 |
| ISBN-10 | : STANFORD:36105031608982 |
| ISBN-13 | : |
| Rating | : 4/5 ( Downloads) |
Book Synopsis Physical Aspects of Electron Microscopy and Microbeam Analysis by : Benjamin M. Siegel
Download or read book Physical Aspects of Electron Microscopy and Microbeam Analysis written by Benjamin M. Siegel and published by . This book was released on 1975 with total page 496 pages. Available in PDF, EPUB and Kindle. Book excerpt: Transmission electron microscopy; Resolution and contrast; Physical applications (Materials and metallurgical applications) using high voltage, conventional, and scanning microscopy; Biophysical: radiation damage; Energy analysis; Instrumentation: field emission illuminaling Systems.
