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Type: BOOK - Published: 2017-07-28 - Publisher: CRC Press
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Language: en
Pages: 372
Pages: 372
Type: BOOK - Published: 2003-04-11 - Publisher: John Wiley & Sons
New material on computerized optical processes, computerized ray tracing, and the fast Fourier transform, Bibre-Bragg sensors, and temporal phase unwrapping. *
Language: en
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Language: en
Pages: 794
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Type: BOOK - Published: 2012-12-06 - Publisher: Springer Science & Business Media
Optical Metrology is a rapidly expanding field i'n both its scientific foundations and technological developments, being of major concern to measurements, quali
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Pages: 212
Type: BOOK - Published: 2012-09-24 - Publisher: John Wiley & Sons
A one-stop, concise guide on determining and measuring thin film thickness by optical methods. This practical book covers the laws of electromagnetic radiation