Related Books
Language: en
Pages: 503
Pages: 503
Type: BOOK - Published: 2012-12-06 - Publisher: Springer Science & Business Media
The Advanced Study Institute provided an opportunity for researchers in universities, industry and National and International Laboratories, from the disciplines
Language: en
Pages: 352
Pages: 352
Type: BOOK - Published: 2012-12-06 - Publisher: Springer Science & Business Media
There have been many books published on scanning tunneling microscopy (STM), atomic force microscopy (AFM) and related subjects since Dr. Cerd Binnig and Dr. He
Language: en
Pages: 1002
Pages: 1002
Type: BOOK - Published: 2007-04-03 - Publisher: Springer Science & Business Media
This volume will be devoted to the technical aspects of electrical and electromechanical SPM probes and SPM imaging on the limits of resolution, thus providing
Language: en
Pages: 375
Pages: 375
Type: BOOK - Published: 2015-02-24 - Publisher: Springer
This book explains the operating principles of atomic force microscopy and scanning tunneling microscopy. The aim of this book is to enable the reader to operat
Language: en
Pages: 563
Pages: 563
Type: BOOK - Published: 2010-12-13 - Publisher: Springer Science & Business Media
The goal of this book is to provide a general overview of the rapidly developing field of novel scanning probe microscopy (SPM) techniques for characterization