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Impact of Electron and Scanning Probe Microscopy on Materials Research
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The Advanced Study Institute provided an opportunity for researchers in universities, industry and National and International Laboratories, from the disciplines
Advances in Scanning Probe Microscopy
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There have been many books published on scanning tunneling microscopy (STM), atomic force microscopy (AFM) and related subjects since Dr. Cerd Binnig and Dr. He
Scanning Probe Microscopy
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This volume will be devoted to the technical aspects of electrical and electromechanical SPM probes and SPM imaging on the limits of resolution, thus providing
Scanning Probe Microscopy
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This book explains the operating principles of atomic force microscopy and scanning tunneling microscopy. The aim of this book is to enable the reader to operat
Scanning Probe Microscopy of Functional Materials
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The goal of this book is to provide a general overview of the rapidly developing field of novel scanning probe microscopy (SPM) techniques for characterization