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Applied Scanning Probe Methods II
Language: en
Pages: 456
Authors: Bharat Bhushan
Categories: Technology & Engineering
Type: BOOK - Published: 2006-06-22 - Publisher: Springer Science & Business Media

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The Nobel Prize of 1986 on Sc- ningTunnelingMicroscopysignaled a new era in imaging. The sc- ning probes emerged as a new - strument for imaging with a p- cisio
Applied Scanning Probe Methods II
Language: en
Pages: 420
Authors: Bharat Bhushan
Categories: Technology & Engineering
Type: BOOK - Published: 2010-02-12 - Publisher: Springer

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The Nobel Prize of 1986 on Sc- ningTunnelingMicroscopysignaled a new era in imaging. The sc- ning probes emerged as a new - strument for imaging with a p- cisio
Applied Scanning Probe Methods XII
Language: en
Pages: 271
Authors: Bharat Bhushan
Categories: Technology & Engineering
Type: BOOK - Published: 2008-10-24 - Publisher: Springer Science & Business Media

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Crack initiation and growth are key issues when it comes to the mechanical reliab- ity of microelectronic devices and microelectromechanical systems (MEMS). Es-
Scanning Tunneling Microscopy II
Language: en
Pages: 359
Authors: Roland Wiesendanger
Categories: Science
Type: BOOK - Published: 2013-03-08 - Publisher: Springer Science & Business Media

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Scanning Tunneling Microscopy II, like its predecessor, presents detailed and comprehensive accounts of the basic principles and the broad range of applications
Applied Scanning Probe Methods XI
Language: en
Pages: 281
Authors: Bharat Bhushan
Categories: Technology & Engineering
Type: BOOK - Published: 2008-10-22 - Publisher: Springer Science & Business Media

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The volumes XI, XII and XIII examine the physical and technical foundation for recent progress in applied scanning probe techniques. These volumes constitute a