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Type: BOOK - Published: 2006-06-22 - Publisher: Springer Science & Business Media
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Type: BOOK - Published: 2010-02-12 - Publisher: Springer
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Type: BOOK - Published: 2008-10-24 - Publisher: Springer Science & Business Media
Crack initiation and growth are key issues when it comes to the mechanical reliab- ity of microelectronic devices and microelectromechanical systems (MEMS). Es-
Language: en
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Type: BOOK - Published: 2013-03-08 - Publisher: Springer Science & Business Media
Scanning Tunneling Microscopy II, like its predecessor, presents detailed and comprehensive accounts of the basic principles and the broad range of applications
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The volumes XI, XII and XIII examine the physical and technical foundation for recent progress in applied scanning probe techniques. These volumes constitute a